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Tiimalasi |
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Tiimalasi tiedotuslehti 1/2005 |
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Tiimalasi tiedotuslehti 2/2004 |
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Tiimalasi tiedotuslehti 1/2006 |
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Tiimalasi tiedotuslehti 2/2005 |
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MIKESille tutkimusprofessori |
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Sisäisen laadunohjauksen opas kemian laboratorioille |
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MIKES Metrologia Biennial Report 2007-2008 |
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Metrologian vuosikertomus 2003 |
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Nature Highlight: uusi virtalähde kvanttimetrologiakolmioon |
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MIKES Metrology Annual Report 2006 |
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MIKES Metrology Annual Report 2005 |
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Kvalitatiivisen kemian metrologian opas orgaanisten yhdisteiden tunnistukseen, J5/2006 |
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Tiimalasi tiedotuslehti 2/2004 |
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Kemian metrologian opas |
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MIKES-talon vihkiäiset 11.1.2006 Espoon Otaniemessä |
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Kotimaiset vertailumittaukset 2004 |
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Tiimalasi tiedotuslehti 1/2007 |
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Tiimalasi tiedotuslehti 2/2006 |
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MIKES, Oulun yliopisto ja Kajaanin kaupunki solmivat kumppanuussopimuksen 5.5.2008 |
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European co-operation for Accreditation |
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FINAS-esite |
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MIKES-esite |
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 | Metrologian julkaisuja |  |
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Thermometer comparison L12 in the range from -80 °C to 400 °C J8/2005 |
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Intercomparison in Gauge Pressure Range from -95 kPa to +100 kPa J1/2006 |
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MIKES Metrology Annual Report 2005 |
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Laitteisto termoelementtien epähomogeenisuuden mittaukseen |
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25 MHz:n normaalitaajuusvastaanottimen suunnittelu |
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Kemian metrologian opas |
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J-julkaisu 1/2005: Mikrobiologiset vertailukannat |
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Finnish National Standards Laboratories, Annual Report 2003, MIKES Julkaisu J1/2004. |
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Pituuden vertailumittaus D7 J9/2005 |
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 | Esitelmät |  |
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Mittayksikköjärjestelmän fysikaaliset perusteet - sähkösuureet |
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MIKES' Combined white light and 633 nm interferometer (eng.) |
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Painemetrologia |
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Metrologia yleisesti |
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Lämpötilametrologia |
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Massametrologia |
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Traceable Nanometrology |
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 | Konferenssijulkaisut |  |
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Applicability of Coaxial Cables at Picosecond Range Timing, Proceedings of 2006 EFTF Meeting (Braunschweig, Germany, 27 -29 March, 2006), pp. 499-502 |
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Application of the quantum Hall effect for the realisation of SI unit of resistance at VTT |
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 | Muut julkaisut |  |
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Tyhjiön mittauksia koskeva kysely. Yhteenveto tuloksista |
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in Proc. XVII IMEKO World Congress, June 22-27, 2003, Dubrovnik, Croatia, 1886-1890. |
Absolute calibration of quartz bars of väisälä interferometer by white light gauge block interferometer |
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in: D. Zvizdic (ed.), Proc. Tempmeko 2004, Vol.2, LPM/FSB 2005, pp. 1037-1042 |
Comparison of realizations of the triple-point of water (EUROMET project No. 549 |
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1/2008 |
Tiimalasi 1/2008 |
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 | Konferenssijulkaisut |  |
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12. konf. Måleteknikk og Kalibrering (Helsinki, 19 - 21 April, 1989) |
Time comparison using Russian radionavigation system |
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2001-05-11 |
Kalibroinnissa termi CMC korvaa BMC:n |
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2003 n:o 1 |
FINAS-bulletiini 1/2003 |
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2003 n:o 2 |
FINAS-bulletiini 2/2003 |
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2003 n:o 3 |
FINAS-bulletiini 3/2003 |
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2003 n:o 4 |
FINAS-bulletiini 4/2003 |
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2004 n:o 1 |
FINAS-bulletiini 1/2004 |
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2004 n:o 2 |
FINAS-bulletiini 2/2004 |
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2004 n:o 3 |
FINAS-bulletiini 3/2004 |
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2004 n:o 4 |
FINAS-bulletiini 4/2004 |
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 | Tieteelliset julkaisut |  |
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2005 Meas. Sci. Technol. 16 N33-N37 |
An absolute pressure balance with a removable weight exchange system |
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 | FINAS-bulletiini |  |
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2005 n:o 1 |
FINAS Bulletiini 1/2005 |
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2005 n:o 2 |
FINAS Bulletiini 2/2005 |
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2005 n:o 3 |
FINAS Bulletiini 3/2005 |
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2005 n:o 4 |
FINAS Bulletiini 4/2005 |
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2006 n:o 1 |
FINAS Bulletiini 1/2006 |
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2006 n:o 2 |
FINAS Bulletiini 2/2006 |
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2006 n:o 3 |
FINAS Bulletiini 3/2006 |
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2006 n:o 4 |
FINAS Bulletiini 4/2006 |
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2006/2 |
Tiimalasi tiedotuslehti 2/2006 |
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2006-12-31 |
Akkreditointipäätökset v. 2006 |
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 | FINAS-bulletiini |  |
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2007 n:o 1 |
FINAS Bulletiini 1/2007 |
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2007 n:o 2 |
FINAS Bulletiini 2/2007 |
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 | Tiimalasi-tiedotuslehti |  |
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2007/1 |
Tiimalasi tiedotuslehti 1/2007 |
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2007-12-01 |
Menettelyt pätevyyden osoittamiseksi EU:n päästökauppaan liittyvissä polttoaine- ja materiaaliominaisuuksien määrityksissä |
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2007-12-14 |
Akkreditointivaatimuksena olevien standardien käyttö vaatimuksenmukaisuuden arvioinnissa |
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2007-12-31 |
Akkreditointipäätökset v. 2007 |
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 | FINAS-bulletiini |  |
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2008 n:o 1 |
FINAS-Bulletiini 1/2008 |
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2008 n:o 2 |
FINAS-Bulletiini 2/2008 |
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 | Tiedotteet |  |
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2008-01-01 |
FINASin kansainväliset sopimukset |
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2008-01-01 |
Vaatimustenmukaisuuden arviointiasiain neuvottelukunta, Pätevyyden toteamistoimen jaosto (VANK-P) |
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2008-04-11 |
Handling of deviating samples by competent laboratories / disclaimers in reports |
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2008-04-11 |
FINASin vuosi 2007 |
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2008-04-11 |
Puutteellisten näytteiden käsittely |
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2008-12-29 |
FINAS-akkreditointipalvelun menettelyt akkreditointitoiminnassa |
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2008-12-31 |
Akkreditointipäätökset v. 2008 |
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 | FINAS-bulletiini |  |
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2009 n:o 1 |
FINAS-Bulletiini 1/2009 |
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2009 n:o 2 |
FINAS Bulletiini 2/2009 |
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2009-01-08 |
Saate IAF-ILAC-ISO julkilausumaan 2009 (ISO/IEC 17025) |
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2009-01-08 |
ISO/IEC 17025 johtamisjärjestelmään liittyvät vaatimukset verrattuna ISO 9001 vaatimuksiin: IAF-ILAC-ISO julkilausuma 2009 |
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2009-03-03 |
Vastuuhenkilön nimitiedot pois pätevyysalueen kuvauksesta |
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2009-04-01 |
Sopimus eurooppalaisesta akkreditointijärjestelmästä |
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2009-11-25 |
Saate IAF-ILAC-ISO -julkilausumaan 2009 (ISO 15189) |
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2009-11-25 |
ISO 15189 johtamisjärjestelmään liittyvät vaatimukset verrattuna ISO 9001 vaatimuksiin: IAF-ILAC-ISO julkilausuma 2009 |
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2009-12-31 |
Akkreditointipäätökset v. 2009 |
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 | FINAS-bulletiini |  |
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2010 n:o 1 |
FINAS-Bulletiini 1/2010 |
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 | Tiedotteet |  |
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4th EURAMET Electricity and Magnetism Contact Persons Meeting 28.-29.10.2010 |
4th EURAMET Electricity and Magnetism Contact Persons Meeting 28.-29.10.2010. Registration www.mikes.fi > in English > Seminars and training |
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 | Arviointiperiaatteet |  |
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A1/2004 |
Periaatteet standardin SFS-EN ISO/IEC 17025 mukaisen näytteenottotoiminnan arvioimiseksi |
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A2/2004 |
FINASin vertailumittauspolitiikka |
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A3/2007 |
Periaatteet mukautuvan pätevyysalueen arvioinnille |
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A4/2007 |
Akkreditoinnin ylläpitämisen arviointiperiaatteet |
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A5/2007 |
Alakohtaiset arviointiohjelmat - FINASin toimintaperiaatteet |
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A6/2010 |
Viranomaisyhteistyön periaatteet |
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A7/2010 |
Akkreditoinnin hyödyntäminen uusilla alueilla - näkemyksiä akkreditointikelpoisuudesta |
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Abstracts of the 6th European Conference on Applied Superconductivity (EUCAS 2003), Naples, Italy, 14 - 18 September, 2003, p. 15 |
Development of a Josephson voltage standard for AC applications |
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 | Tieteelliset julkaisut |  |
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Appl. Phys. Lett. 90 (2007) 082102 |
Nanoampere pumping of Cooper pairs |
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Appl. Phys. Lett. 92 (2008) 052110 |
Suppression of the critical current of a balanced superconducting quantum interference device |
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Appl. Phys. Lett. 94 (2009) 172108 |
Experimental investigation of hybrid single-electron turnstiles with high charging energy |
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Appl. Phys. Lett. 95 (2009) 112507 |
Pumping properties of the hybrid single-electron transistor in dissipative environment |
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Applied Optics 33 (1994) 3600-3603 |
Interferometer for calibration of graduated line scales with a moving CCD camera as a line detector |
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Applied Optics 38 (1999) 1709-1713 |
Method for characterisation of filter radiometers |
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Applied Optics, Vol. 42, No.6 (2003) 1019-1028 |
Comparison of 127I2-stabilized frequency-doubled Nd:YAG lasers at the Bureau International des Poides et Mesures |
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Applied Physics B, 81 (2005) 1053-1057 |
amplifier for femtosecond frequency comb measurements near 633 nm |
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 | Tiedotteet |  |
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Asiakaskysely 2008 |
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Automaatio 09 -messut |
MIKES ja Measurepolis Automaatio 09 -messuilla 23.-25.9.2009. Tervetuloa osastollemme 6e9! |
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 | Muut julkaisut |  |
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Automaatioväylä nro. 5 / 2003 |
Kalibrointilaitteisto pienille kaasuvirtausmittareille |
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CEC-P-01-02 |
ISO/IEC 17025 interpretation document for CEC test methods |
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 | Konferenssijulkaisut |  |
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Conference Digest, CPEM 2000 (Sydney, Australia, 14 - 19 May, 2000), pp. 102 - 103 |
100 Ohm transfer standard |
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Conference Digest, CPEM 2000 (Sydney, Australia, 14 - 19 May, 2000), pp. 399 - 401 |
Progress in Josephson voltage standard development |
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Conference Digest, CPEM 2000 (Sydney, Australia, 14 - 19 May, 2000), pp. 401 - 402 |
Measurement uncertainty in the 1/f noise region: Zener voltage standards |
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Conference Digest, CPEM 2000 (Sydney, Australia, 14 - 19 May, 2000), pp. 41 - 42 |
Automatic high precision audio frequency power standard |
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Conference Digest, CPEM 2000 (Sydney, Australia, 14 - 19 May, 2000), pp. 560 - 561 |
Quick comparison of QHR system using a 100 Ohm transfer resistor |
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Conference Digest, CPEM 2002 (Ottawa, Canada, 16 - 21 June, 2002), pp. 230 - 231 |
50 Hz current measurements with Rogowski coils |
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Conference Digest, CPEM 2002 (Ottawa, Canada, 16 - 21 June, 2002), pp. 370 - 371 |
New AC current shunts of MIKES |
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Conference Digest, CPEM 2002 (Ottawa, Canada, 16 - 21 June, 2002), pp. 498 - 499 |
Towards quantum AC voltage standard |
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Conference Digest, CPEM 2002 (Ottawa, Canada, 16 - 21 June, 2002), pp. 56 - 57 |
Resistance scaling from 10 mΩ to 10 kΩ at MIKES with cryogenic current comparator and Guildline bridges |
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Conference Digest, CPEM 2002 (Ottawa, Canada, 16-21 June 2002), pp. 510 – 511. |
Calorimetric measurements on losses in superconducting materials |
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Conference Digest, CPEM 2004 (London, UK, 27 June - 2 July, 2004), p. 265 |
Nordic comparison of the calibration of 1 Ohm and 10 kOhm resistors EUROMET.EM-S18 |
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Conference Digest, CPEM 2004 (London, UK, 27 June - 2 July, 2004), pp. 119-120 |
AC voltage reference based on a capacitive micromechanical component |
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Conference Digest, CPEM 2004 (London, UK, 27 June - 2 July, 2004), pp. 154-155 |
Fast Josephson arrays for voltage and impedance metrology |
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Conference Digest, CPEM 2004 (London, UK, 27 June - 2 July, 2004), pp. 158-159 |
Development of a quantum AC voltage standard based on externally shunted Josephson arrays |
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Conference Digest, CPEM 2004 (London, UK, 27 June - 2 July, 2004), pp. 170-171 |
A DC voltage reference based on MEMS |
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Conference Digest, CPEM 2004 (London, UK, 27 June - 2 July, 2004), pp. 384-385 |
Progress in development of the measurement equipment for the link between DC QHR and capacitance standards in MIKES |
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Conference Digest, CPEM 2004 (London, UK, 27 June - 2 July, 2004), pp. 516-517 |
Experience with AC calibration of conventional CCC |
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Conference Digest, CPEM 2004, London, 166 – 167, 2004 |
On possible use of quantized voltages of shapiro steps for absolute inductance calibration and governing direct currents |
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Conference Digest, CPEM 2006 (Torino, Italy, 9 - 14 July, 2006), pp. 164 - 165 |
Development of a Cooper pair pump with combined flux and voltage control |
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Conference Digest, CPEM 2006 (Torino, Italy, 9 - 14 July, 2006), pp. 202 - 203 |
Bilateral comparison MIKES - SP of calibration of 1 nF, 10 nF, 100 nF and 1 µF capacitors |
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Conference Digest, CPEM 2006 (Torino, Italy, 9 - 14 July, 2006), pp. 210 - 211 |
Rogowski coil setup for calibration of AC currents up to 10 kA |
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Conference Digest, CPEM 2006 (Torino, Italy, 9 - 14 July, 2006), pp. 224 - 225 |
MEMS-based AC voltage reference stabilized by compensation of built-in voltage |
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Conference Digest, CPEM 2006 (Torino, Italy, 9 - 14 July, 2006), pp. 276 - 277 |
Worldwide comparison of lightning impulse voltage measuring systems at 400 kV level |
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Conference Digest, CPEM 2006 (Torino, Italy, 9 - 14 July, 2006), pp. 340 - 341 |
High accuracy comparison of lightning and switching impulse calibrators |
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Conference Digest, CPEM 2006 (Torino, Italy, 9 - 14 July, 2006), pp. 348 - 349 |
Determination of absolute dissipation factor of standard capacitors |
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Conference Digest, CPEM 2006 (Turin, Italy, 9-14 July 2006) |
Losses in niobium at low frequency magnetic fields |
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Conference Digest, CPEM 2008 (Broomfield, Colorado, 8-13 June 2008) |
Mass determination with the magnetic levitation method |
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Conference Digest, CPEM 2008 (Broomfield, Colorado, USA, 8 - 13 June, 2008), pp. 150 - 151 |
NiCr based thin film cryo resistors |
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Conference Digest, CPEM 2008 (Broomfield, Colorado, USA, 8 - 13 June, 2008), pp. 272 - 273 |
Atomic layer deposited alumina (Al2O3) coating on thin film cryoresistors |
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Conference Digest, CPEM 2008 (Broomfield, Colorado, USA, 8 - 13 June, 2008), pp. 352 - 353 |
Subpicoampere current source based on a digital-to-analog converter |
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Conference Digest, CPEM 2008 (Broomfield, Colorado, USA, 8 - 13 June, 2008), pp. 372 - 373 |
An accurate asynchronous calculation method for evaluating peak and RMS values from sampled data |
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Conference Digest, CPEM 2008 (Broomfield, Colorado, USA, 8 - 13 June, 2008), pp. 468 - 469 |
On-site calibration of a current transformer using a Rogowski coil |
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Conference Digest, CPEM 2008 (Broomfield, Colorado, USA, 8 - 13 June, 2008), pp. 50 - 51 |
Development of a square-wave based ac Josephson system for ac voltage metrology |
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Conference Digest, CPEM 2008 (Broomfield, Colorado, USA, 8 - 13 June, 2008), pp. 542 - 543 |
Influence of busbar geometry on AC current measurement using Rogowski coil |
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Conference Digest, CPEM 2008 (Broomfield, Colorado, USA, 8 - 13 June, 2008), pp. 630 - 631 |
Towards direct closure of the quantum metrological triangle |
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Conference Digest, CPEM 2010 (Daejeon, Korea, 13 - 18 June, 2010), pp. 125 - 126 |
Development of the SINIS turnstile for the quantum metrological triangle |
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Conference Digest, CPEM 2010 (Daejeon, Korea, 13 - 18 June, 2010), pp. 209 - 210 |
DC voltage standard based on square wave excitation of a micromechanical capacitive sensor |
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Conference Digest, CPEM 2010 (Daejeon, Korea, 13 - 18 June, 2010), pp. 227 - 228 |
Comparison of asynchronous sampling correction algorithms for power quality measurements under realistic conditions |
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Conference Digest, CPEM 2010 (Daejeon, Korea, 13 - 18 June, 2010), pp. 231 - 232 |
A survey of current shunts for AC power measurements |
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Conference Digest, CPEM 2010 (Daejeon, Korea, 13 - 18 June, 2010), pp. 253 - 254 |
The EMRP project metrology for energy harvesting |
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Conference Digest, CPEM 2010 (Daejeon, Korea, 13 - 18 June, 2010), pp. 293 - 294 |
Characterization of epitaxial graphene structures |
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Conference Digest, CPEM 2010 (Daejeon, Korea, 13 - 18 June, 2010), pp. 382 - 383 |
Comparison of different methods of inductance realisation |
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Conference Digest, CPEM 2010 (Daejeon, Korea, 13 - 18 June, 2010), pp. 386 - 387 |
Evaluation of 100 mH inductance by series resonance method in VNIIM and in MIKES |
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Conference Digest, CPEM 2010 (Daejeon, Korea, 13 - 18 June, 2010), pp. 408 - 409 |
Verification of performance of commercial LCR meters |
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Conference Digest, CPEM 2010 (Daejeon, Korea, 13 - 18 June, 2010), pp. 54 - 55 |
Transition shape effect in the transients generated by a programmable Josephson voltage standard |
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Conference Digest, CPEM 2010 (Daejeon, Korea, 13 - 18 June, 2010), pp. 58 - 59 |
Impedance measurements with programmable Josephson systems |
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Conference Digest, CPEM 2010 (Daejeon, Korea, 13 - 18 June, 2010), pp. 641 - 642 |
Temperature dependence of Pd thin film cryo resistors |
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 |
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Conference Digest, CPEM 2010 (Daejeon, Korea, 13 - 18 June, 2010), pp. 653 - 654 |
Uncertainty estimate of a split-core Rogowski coil for high AC current |
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 |
 |
Conference Digest, CPEM 2010 (Daejeon, Korea, 13 - 18 June, 2010), pp. 669 - 670 |
Metrology for high voltage direct current |
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 |
 |
Conference Digest, CPEM 94 (Boulder, USA, 1994) |
Design and optimization of range resistors for a multijunction thermal converter |
 |
 |
 |
Conference Digest, CPEM 94 (Boulder, USA, 1994), pp. 206 - 207 |
Frequency dependence of some 100 Ohm resistors measured with a CCC-based AC resistance bridge |
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Conference Digest, CPEM 96 (Braunschweig, 6 - 10 July, 1996), pp. 252 - 253 |
Determination of Ohm-VTT using the quantum Hall resistance |
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 |
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Conference Digest, CPEM 96 (Braunschweig, 6 - 10 July, 1996), pp. 402 - 403 |
AC resistance bridge based on the cryogenic current comparator |
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 |
Conference Digest, CPEM 98 (Washington DC, USA, 6 - 10 July, 1998), pp. 106 - 107 |
Micromechanical silicon scale |
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 |
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Conference Digest, CPEM 98 (Washington DC, USA, 6 - 10 July, 1998), pp. 159 - 160 |
Thin-film cryogenic current comparator |
 |
 |
 |
Conference Digest, CPEM 98 (Washington DC, USA, 6 - 10 July, 1998), pp. 23 - 24 |
AC and DC voltage standards based on silicon micromechanics |
 |
 |
 |
Conference Digest, CPEM 98 (Washington DC, USA, 6 - 10 July, 1998), pp. 412 - 413 |
Improvements in the quantum Hall resistance standard at VTT |
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 |
 |
Conference Digest, CPEM92 (Paris, France, 8 - 12 June, 1992), pp. 286 - 287 |
A cryogenic current comparator based on a low-noise DC SQUID and a DC coupled readout electronics |
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 |
 |
Conference on Precision Electromagnetic Measurements, June 8–13, 2008, Broomfield, USA, Conference Digest, pp. 172–173. |
Single-frequency synthesis at telecommunication wavelengths |
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Conference on Precision Electromagnetic Measurements, June 8–13, 2008, Broomfield, USA, Conference Digest, pp. 180–181. |
Fiber-based acetylene-stabilized laser |
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 |
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Conference on Precision Electromagnetic Measurements, June 8–13, 2008, Broomfield, USA, Conference Digest, pp. 312–313. |
Absolute frequency measurement of an iodine-stabilized 543-nm He-Ne laser with modulation-synchronized phase-locked loop for improved frequency counting |
 |
 |
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Conference on Precision Electromagnetic Measurements, May 14–19, 2000, Sydney, Australia, Conference Digest, pp.679–680. |
A compact iodine stabilized external-cavity diode laser at 633 nm with a novel transmission grating |
 |
 |
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Conference Proceedings, NCSL International 2004, Salt Lake City, 2004 |
A weight exchange system for an absolute pressure balance |
 |
 |
 |
Convention on Radio Science Abstracts of Papers (Espoo, 17 - 18 October, 1988) |
Stability of Russian radionavigation system in Helsinki |
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Convention on Radio Science Abstracts of Papers (Espoo, 17 - 18 October, 1988) |
Stability of TV transmission delay between Oulu and Helsinki |
 |
 |
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Convention on Radio Science Abstracts of Papers (Espoo, Finland, 17 - 18 October, 1988) |
Time and frequency standards in Finland |
 |
 |
 |
Digest of Technical Papers, URSI XXVI Convention on Radio Science (Tampere, Finland, 23 - 24 October, 2001), pp. 19 - 20 |
High precision 50 Hz current measurements with Rogowski coils |
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Digest of Technical Papers, URSI XXVI Convention on Radio Science (Tampere, Finland, 23 - 24 October, 2001), pp. 21 - 22 |
AC voltage stepup of MIKES |
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Digest of Technical Papers, URSI XXVI Convention on Radio Science (Tampere, Finland, 23 - 24 October, 2001), pp. 47 - 48 |
Automatic dc voltage maintenance system at MIKES |
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Digest of Technical Papers, URSI XXVI Convention on Radio Science (Tampere, Finland, 23 - 24 October, 2001), pp. 49 - 50 |
Improvements in resistance calibration service in MIKES |
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Digest of Technical Papers, URSI XXVI Convention on Radio Science (Tampere, Finland, 23 - 24 October, 2001), pp. 51 - 52 |
AC current shunts of MIKES |
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Digest of Technical Papers, URSI XXVII Convention on Radio Science (Espoo, Finland, 17 - 18 October, 2002), pp. 195 - 197 |
Analysis of application of a cryogenic current comparator bridge for the measurements of capacitance standards |
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 | Tieteelliset julkaisut |  |
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DOI: 10.1007/s10765-007-0283-y, Int. J. Thermophysics |
Intercomparison of the realization of the ITS-90 at the freezing points of Al and Ag between European NMIs |
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EA- 1/01 |
List of EA Publications |
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EA- 2/05:2001 |
The Scope of Accreditation and Consideration of Methods and Criteria for Assessment of the Scope in Testing |
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EA- 2/09:2000 |
EA Policy on the Accreditation of Providers of Proficiency Testing Schemes |
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EA- 2/10:2001 |
EA Policy for Participation in National and International Proficiency Testing Activities |
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EA- 2/11:2006 |
EA Policy for Conformity Assessment Schemes (Sector Shemes) |
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EA- 2/13:2007 |
EA Cross Frontier Policy fo Cooperation between EA Members |
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EA -2/14:2008 |
Procedure for Regional Calibration ILCs in Support of the EA MLA |
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EA -2/15:2008 |
Requirements for the Accreditation of Flexible Scopes |
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EA -2/17:2009 |
EA Guidance on the horizontal requirements for the accreditation of conformity assessment bodies for notification purposes |
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EA- 3/01:2009 |
EA Conditions for the use of Accreditation Symbols, Text Reference to Accreditation and MLA Signatory Status |
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EA- 3/04:2001 |
Use of Proficiency Testing as a Tool for Accreditation in Testing (with EUROLAB and EURACHEM) |
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EA- 3/08:2003 |
EA Guidelines on the application of EN 45010 |
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EA- 3/09:1999 |
Surveillance and Reassessment of accredited organisations |
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EA -3/11:2009 |
on Food Safety Management Systems - Scope of Accreditation |
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EA -4/02:1999 |
Expression of the Uncertainty of Measurements in Calibration |
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EA- 4/07:1995 |
Traceability of Measuring and Test Equipment to National Standards, EAL-G12 |
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EA- 4/09:2003 |
Accredition for Sensory Testing Laboratories |
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EA- 4/10:2002 |
Accreditation for Microbiological Laboratories |
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EA- 4/14:2003 |
The Selection and Use of Reference Materials |
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EA- 4/15:2003 |
Accreditation for Bodies Performing non-Destructive Testing |
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EA- 4/16:2003 |
EA guidelines on the expression on uncertainty in quantitative testing |
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EA- 4/17:2008 |
EA Position Paper on the Description of Scopes of Accreditation of Medical Laboratories |
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EA- 4/18:2010 |
Guidance on the level and frequency of proficiency testing participation |
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EA- 5/02:2007 |
EA Guidance on the application of EN 45004 in recurrent inspection of motor vehicles |
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EA- 5/03:2008 |
Guidance for the Implementation of ISO/IEC 17020 in the field of crime scene investigation |
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EA- 6/01:1999 |
EA Guidelines on the Application of EN 45011 |
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EA- 6/02:2007 |
EA Guidelines on the Use of EN 45011 and ISO/IEC 17021 for Certification to EN ISO 3834 |
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EA- 6/03:2010 |
EA Document for Recognition of Verifiers under the EU ETS Directive |
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EA- 7/03:2000 |
EA Guidelines for the Accreditation of bodies operating certification/registration of Information Security Management Systems |
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EA- 7/04:2010 |
Legal Compliance as a part of accredited ISO 14001: 2004 certification |
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EA- 7/05:2008 |
EA Guidance on the Application of ISO/IEC 17021:2006 for combined Audits |
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Electra 179 (1998) 24 - 37 |
International intercomparison of direct and switching impulse voltage measurement systems with zener-diode based reference DWINA |
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Electra 189 (2000) 83 - 109 |
Use of low voltage calibrators in impulse voltage measurements |
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Eur. Phys. J. Special Topics 172 (2009) 311 - 321 |
Quantized current of a hybrid single-electron transistor with superconducting leads and a normal-metal island |
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Eur. Phys. J. Special Topics 172 (2009) 323-332 |
Thermometry by micro and nanodevices |
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EURAMET |
Guides on calibration activity |
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EURAMET Newsletter |
EURAMET Newsletter |
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EUROLAB |
Guidance for the management of computers and software in laboratories with reference to ISO/IEC 17025:2005 (Technical report no 2/2006) |
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 | Muut julkaisut |  |
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EUROMET M&DQ Newsletter Issue 6 (1998) 15 - 19 |
Comparison of gas pressure measurements (gauge mode) in the range 0,5 MPa to 5 MPa |
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Eurooppalainen metrologiaohjelma – ympäristö- ja teollisuusmittaukset -seminaari 5.3.2010 |
Eurooppalainen metrologiaohjelma – ympäristö- ja teollisuusmittaukset -seminaari 5.3.2010. Ilmoittautuminen kohdassa Koulutus. |
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Experimental Thermal and Fluid Science 32/2 (2007) 459-466 |
The varying effect of natural convection on shear stress rate on cylindrical surfaces |
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Extended abstracts of ISEC 2005 (Noordwijkerhout, The Netherlands, 5 - 9 September, 2005), paper P-K.12 |
AC voltage standard based on an externally shunted SIS Josephson junction array |
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 | Akkreditointivaatimukset |  |
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EY N:o 761/2001 |
Euroopan parlamentin ja neuvoston asetus organisaatioiden vapaaehtoisesta osallistumisesta yhteisön ympäristöasioiden hallinta- ja auditointijärjestelmään (EMAS-järjestelmä) |
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FINAS S21/2008 |
Tietotekniikan arviointi akkreditointimenettelyssä |
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FINAS S51/2000 |
Opas näytteenoton teknisten vaatimusten täyttämiseksi akkreditointia varten |
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FINAS S51/2000 liite 1 |
Näytteenoton virhelähteet, luotettavuuden estimointi ja näytteenottoketjun optimointi |
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FINAS S51/2000 liite 1 esim. 1 |
Vuotuisen rikkitaseen määrittäminen sellutehtaalle |
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FINAS S51/2000 liite 1 esim. 2 |
Esimerkki näytteenottovirheen (integrointivirheen) laskemisesta näytevälin funktiona käyttäen P. Gyn |
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FINAS S51/2000 liite 1 esim. 3 |
Esimerkki puhdistetun jäteveden rikkipitoisuuden määrityksen epävarmuuden estimoinnista |
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FINAS S51/2000 liite 1 esim. 4 |
Funktioita (Mathcad), joita voidaan käyttää P. Gyn teorian mukaisen perushajonnan laskemisessa |
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FINAS S51/2000 liite 1 esim. 5 |
Esimerkkejä ositetun otannan käytöstä |
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FINAS S51/2000 liite 1 esim. 6 |
Eri vaihtoehtojen tutkiminen haarautuvassa monivaiheisessa näytteenottoketjussa |
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FINAS S51/2000 liite 2 |
Vesi- ja vesistönäytteet |
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FINAS S51/2000 liite 4 |
Elintarvike-, rehu- ja lannoitenäyteet sekä mikrobiologiset näytteet yleensä |
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FINAS S51/2000 liite 5 |
Päästömittaukset |
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FINAS S51/2000 liite 6 |
Kliinisten määritysten näytteet |
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FINAS S51/2000 liite 7 |
Maaperänäytteet |
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FINAS S51/2000 liite 7 esimerkki |
Esimerkki eräästä maaperänäytteenotossa käytetystä ohjeesta |
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 | Akkreditointivaatimukset |  |
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FINAS V1/2007 |
Akkreditointiin viittaamisen säännöt |
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 | Tiedotteet |  |
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FINAS-hinnasto 2010 |
FINAS-hinnasto 2010 |
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 | Esitelmät |  |
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FINAS-päivä 2006 |
Virtauksen kansallinen mittanormaalilaboratorio |
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FINAS-päivä 2006 |
Akkreditoinnin ajankohtaisia asioita |
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FINAS-päivä 2007 |
VR:n tekemät oikoradan mittaukset |
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 | Tiedotteet |  |
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FINAS-tiedote 10 |
Akkreditointitoiminnan vaatimukset, arviointiperiaatteet ja oppaat, 15.8.2010 |
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 | Oppaat |  |
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FINAS-tiedote 10 |
Akkreditointitoiminnan vaatimukset, arviointiperiaatteet ja oppaat, 15.8.2010 |
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FINAS-tiedote 10 |
Akkreditointitoiminnan vaatimukset, arviointiperiaatteet ja oppaat, 15.8.2010 |
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 | Tiedotteet |  |
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Finntesting kevätseminaari 2010 |
Finntesting kevätseminaari 2010 - Laboratorioiden tulevaisuus Suomessa. Ilmoittautuminen kohdassa Koulutus. |
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Geometristen toleranssien teemapäivä 6.5.2010. |
GPS – UUDET TUULET TOLEROINNISSA Geometristen toleranssien teemapäivä 6.5.2010. Ilmoittaudu mukaan kohdassa Koulutus. |
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 | Lomakkeet ja hakemukset |  |
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Hakemus |
Akkreditointihakemus |
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Hyperfine Interactions 135 (2001) 167 - 190 |
Experiments with coherent gamma fields: gamma echo and related phenomena |
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IAF |
IAF Guide on the Application of ISO 9001:2001 |
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IAF GD 2:2005 |
Guidance on the Application of Guide 62:1996 |
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IAF GD 3:2003 |
Guidance on Cross Frontier Accreditation |
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IAF GD 5:2006 |
Guidance on the Application of ISO/IEC Guide 65:1996 |
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IAF GD24:2009 |
Guidance on the Application of ISO/IEC 17024:2003 |
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IAF MD 1:2007 |
Certification of Multiple Sites Based on Sampling |
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IAF MD 2:2007 |
Transfer of Accredited Certification of Management Systems |
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IAF MD 3:2008 |
Advanced Surveillance and Recertification Procedures (ASRP) |
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IAF MD 4:2008 |
Use of Computer Assisted Auditing Techniques ("CAAT") for Accredited Certification of Management Systems |
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IAF MD 5:2009 |
Duration of QMS and EMS Audits |
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IAF MD 6:2009 |
Application of ISO 14065:2007 |
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IAF ML 2:2004 |
General Principles on Use of the IAF MLA Mark |
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IAF/ILAC A5:04/2009 |
IAF/ILAC MLA/MRA: Application of ISO/IEC 17011:2004 |
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IAF/ILAC-A4:2004 |
Guidance on the Application of ISO/IEC 17020:1998 |
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IEE Trans. Instrum. Meas. 56 (2007), pp. 500-504 |
Traceability of laser Frequency Calibrations at MIKES |
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IEEE LEOS Summer Topicals 2005, Optical frequency & time measurement and generation, San Diego, USA, July 25-27, 2005, pp. 33-34 |
Frequency comb generator for calibration of laser frequency standards |
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IEEE Trans. Appl. Superc. 57 (1993) 406 - 409 |
A coupled DC SQUID with low 1/f noise |
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IEEE Trans. Appl. Supercond. 17 (2007) 930 - 933 |
Millimeter wave engineering of distributed Josephson junction arrays |
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IEEE Trans. Instrum. Meas. 44 (1995) 276 - 280 |
Frequency dependence of 100 Ohm standard resistors measured with a CCC-based AC resistance bridge |
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IEEE trans. Instrum. Meas. 46 (1997) 186-190 |
Frequency shifts of iodine stabilized He-Ne lasers at higher harmonic order stabilization |
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IEEE Trans. Instrum. Meas. 46 (1997) 463 - 466 |
AC resistance bridge based on the cryogenic current comparator |
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IEEE Trans. Instrum. Meas. 48 (1999) 365 - 369 |
Thin-film cryogenic current comparator |
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IEEE Trans. Instrum. Meas. 50 (2001) 238 - 241 |
Comparison of four QHR systems within one month using a temperature and pressure stabilized 100-Ohm |
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IEEE Trans. Instrum. Meas. 50 (2001) 242 - 244 |
Transport behavior of commercially available 100-Ohm standard resistors |
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IEEE Trans. Instrum. Meas. 50 (2001) 453 - 456 |
Measurement uncertainty in the presence of low frequency noise |
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IEEE Trans. Instrum. Meas. 52 (2003) 400 - 403 |
A calculable impulse voltage calibrator for calibration of impulse digitizers |
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IEEE Trans. Instrum. Meas. 52 (2003) 495 - 499 |
Analysis of international comparisons with the minimum variance method |
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IEEE Trans. Instrum. Meas. 52 (2003) 524 - 528 |
Analysis of different measurement setups for a programmable Josephson voltage standard |
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IEEE Trans. Instrum. Meas. 52 (2003) 533 - 537 |
AC voltage standard based on a programmable SIS array |
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IEEE Trans. Instrum. Meas. 52, 236–239 (2003) |
Results from international comparisons at the BIPM providing a world-wide reference network of 127I2 stabilized frequency-doubled Nd:YAG lasers |
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IEEE Trans. Instrum. Meas. 52, 284–287 (2003) |
Frequency stabilization of a diode-pumped Nd:YAG laser at 532 nm to iodine by using third-harmonic technique |
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IEEE Trans. Instrum. Meas. 54 (2005) 576-579 |
Comparison EUROMET.EM-K8 of DC voltage ratio: Results |
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IEEE Trans. Instrum. Meas. 54 (2005) 595-599 |
MEMS-based AC voltage reference |
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IEEE Trans. Instrum. Meas. 54 (2005) 608 - 611 |
Comparison of two impulse calibrators with a high resolution digitizer |
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IEEE Trans. Instrum. Meas. 54 (2005) 632-635 |
Stimulated power generation in ES-SIS junction arrays |
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IEEE Trans. Instrum. Meas. 54 (2005) 636-640 |
Realization of a square-wave voltage with externally-shunted SIS Josephson junction arrays for a quantum AC voltage standard |
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IEEE Trans. Instrum. Meas. 55, 876–880 (2006) |
Absolute frequency measurement of the R(12) 26–0 and R(106) 28–0 transitions in 127I2 at = 543 nm |
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IEEE Trans. Instrum. Meas. 56 (2007) 388 – 391 |
Worldwide comparison of lightning impulse voltage measuring systems at the 400-kV level |
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IEEE Trans. Instrum. Meas. 56 (2007) 619 – 623 |
High-accuracy comparison of lightning and switching impulse calibrators |
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IEEE Trans. Instrum. Meas. 58 (2009) 1054 - 1058 |
Onsite calibration of a current transformer using a Rogowski coil |
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IEEE Trans. Instrum. Meas. 58 (2009) 1183 - 1187 |
Atomic layer deposited alumina (Al2O3) coating on thin film cryoresistors |
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IEEE Trans. Instrum. Meas. 58 (2009) 1206 - 1210 |
Ni-Cr based thin film cryo resistors |
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Strong attenuation of the transients' effect in square waves synthesized with a programmable Josephson voltage standard |
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Zero phase filtering for lightning impulse evaluation: a K-factor filter for the revision of IEC60060-1 and 2 |
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IEEE Transactions on Instrumentation and Measurement 48 (1999) 587-591 |
Iodine-stabilized diode laser at 633 nm: Effects of optical feedback |
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ILAC G10:1996 |
Harminosed Procedures for Surveillance & Reassessment of Accredited Laboratories |
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ILAC G12:2000 |
Guidelines for the requirements for the competence of reference materials producers |
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ILAC G13:2007 |
Guidelines for the requirements for the competence of providers of proficiency testing schemes |
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ILAC G17:2002 |
Introducing the Concept of Uncertainty of Measurement in Testing in Association with the Application of the Standard ISO/IEC 17025 |
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ILAC G18:04/2010 |
Guideline for the Formulation of Scopes of Accreditation for Laboratories |
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ILAC G19:2002 |
Guidelines for Forensic Science Laboratories |
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ILAC G20:2002 |
Guidelines on Grading of Non-conformities |
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ILAC G21:2002 |
Cross Frontier Accreditation - Principles for Avoiding Duplication |
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ILAC G22:2004 |
Use of Proficiency Testing as a Tool for Accreditation in Testing |
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ILAC G24:2007 |
Guidelines for the Determination of Calibration Intervals of Measuring Instruments |
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ILAC G7:06/2009 |
Accreditation requirements and operating criteria for horseracing laboratories |
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ILAC G8:03/2009 |
Guidelines on the Reporting of Compliance with Specification |
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ILAC G9:2005 |
Guidelines for the Selection and Use of Reference Materials |
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ILAC P10:2002 |
ILAC Policy on Traceability for Measurement Results |
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ILAC P8:07/2006 |
ILAC Mutual Recognition Arrangement (Arrangement): Supplementary Requirements and Guidelines for the Use of Accreditation Symbols and for Claims of Accreditation Status by Accredited Laboratories |
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ILAC P9:2005 |
ILAC Policy for Participation in National and International Proficiency Testing Activities |
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ILAC-R7:09/2009 |
Rules for the use of the ILAC MRA Mark |
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Dynamical nonlinearities of piezoelectric materials |
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in Nanotechnology in northern Europe 2006, 16. - 18. May 2006, Helsinki, Finland |
Calibration and traceability of a commercial AFM at MIKES |
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Frequency comb generator for cor calibration of stabilized lasers at MIKES |
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in Papers and abstracts from the Third International Symposium on the Humidity and Moisture, vol 1, |
Comparison of two realization methods for the dew-point temperature scale |
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in Papers and abstracts from the Third International Symposium on the Humidity and Moisture, vol 1, |
The use of a humid air generator as a reference method for measuring humidity |
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in Proc. of 4th International Symposium on Dimensional Metrology in Production and Quality Control, |
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Iodine Stabilised Diode Laser at 633 nm |
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in Proc. SPIE/Optical Sensing and Spectroscopy, Dublin, Ireland, April 4-6, 2005 |
External-cavity diode laser based spectrometer for absolute determination of iodine lines around 633 nm |
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in Proc. XVII IMEKO World Congress, June 22-27, 2003, Dubrovnik, Croatia, 221-224. |
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MIKES frequency comb generator and absolute frequency measurements of iodine-stabilized lasers |
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in Proceedings of 21st Nordic conference on measurements and calibration, Gardermoen, Norway, 1999 |
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in proceedings of 5th International Conference on Tunable Diode Laser Spectroscopy 2005, July 11-15, 2005, Florence, Italy, 2005, p.100 |
Use of injection locking for reducing optical feedback effects and residual amplitude modulation in wavelength modulation spectroscopy |
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In proceedings of euspen International Topical Conference, Aachen, Germany, 2003, p 431 |
A new acoustic method for determination of the effective air temperature for length interferometers |
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In proceedings of euspen International Topical Conference, Glasgow, 2004 |
High-precision automatic machine vision based calibration of micrometers |
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In proceedings of euspen International Topical Conference, Glasgow, 2004 |
Design of a calibration machine of optical two-dimensional length standards |
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in Proceedings of NanoScale 2006, 24. – 25 April, Bern, Swizerland |
Refractive index of air compensation by acoustic method for plane mirror interferometer |
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A new acoustic method for the determination of the refracticve index of air |
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Developement of a frequecy comb generator for precision optical frequency measurements |
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in Proceedings of Tempmeko '99, The 7th International Symposium on Temperature and Thermal measureme |
An apparatus for comparing humidity generators |
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in Proceedings of the 16th Nordic Conference "Måleteknikk og kalibrering", Helsingør, Denmark, Novem |
Traceability of humidity measurements at CMA |
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in Proceedings of the 17th Nordic Conference "Måleteknikk og kalibrering", Halmstad, Sweden, Novembe |
Uncertainty of the humidity calibration in a climatic chamber |
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in Proceedings of the 17th Nordic Conference "Måleteknikk og kalibrering", Halmstad, Sweden, Novembe |
The CMA Humidity Laboratory accepts the challenge |
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in Proceedings of the 17th Nordic Conference "Måleteknikk og kalibrering", Halmstad, Sweden, Novembe |
Reliability of humidity measurements |
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in Proceedings of the 1995 NCSL Workshop and Symposium, Dallas, USA, July 16-20, 1995 |
Realization of the dew-point temperature |
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in Proceedings of the 19th Nordic Conference "Måleteknikk og kalibrering", Nyborg, Denmark, November |
Nordic humidity intercomparison |
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in Proceedings of the 19th Nordic Conference "Måleteknikk og kalibrering", Nyborg, Denmark, November |
Calibration of a hydrometer by means of hydrostatic weighing |
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